Combined ellipsometry and X-ray related techniques for studies of ultrathin organic nanocomposite films

Thin Solid Films

Volumn 518, Issue 19, 2010, Pages 5509-5514

  Krämer, Markus ^a,b   Roodenko, Katy ^a,c   Pollakowski, Beatrix ^d   Hinrichs, Karsten ^a   Rappich, Jörg ^e   Esser, Norbert ^a   Von Bohlen, Alex ^a   Hergenröder, Roland ^a  

^a LEIBNIZ INSTITUT FÜR ANALYTISCHE WISSENSCHAFTEN ISAS E V   (Germany)

^b AXO Dresden GmbH   (Germany)

^c UNIVERSITY OF TEXAS AT DALLAS   (United States)

^d PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^e HAHN MEITNER INSTITUT   (Germany)

Author keywords

Infrared spectroscopic ellipsometry; Optical simulations; Surface modification; Synchrotron; X ray standing waves

Indexed keywords

BEFORE AND AFTER; DEPTH PROFILE; ELECTRON DENSITIES; GOLD EVAPORATION; GOLD ISLANDS; HARD X RAY; INFRARED SPECTROSCOPIC ELLIPSOMETRY; NANOCOMPOSITE FILM; OPTICAL SIMULATION; SOFT X-RAY; SURFACE MODIFICATION; ULTRA-THIN; VERTICAL DIRECTION; X RAY REFLECTIVITY; X-RAY STANDING WAVES;

COMPOSITE FILMS; ELASTIC WAVES; EVAPORATION; GOLD; GOLD COATINGS; MOLECULAR ORIENTATION; NANOCOMPOSITES; NITROBENZENE; OPTICAL PROPERTIES; SPECTROSCOPIC ELLIPSOMETRY; SYNCHROTRONS; ULTRATHIN FILMS; WAVES; X RAY ANALYSIS; X RAYS;

STANDING WAVE METERS;

EID: 77955654412     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2010.04.033     Document Type: Article

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