Correlation between Ga-O signature and midgap states at the Al 2O 3/In 0.53Ga 0.47As interface

Applied Physics Letters

Volumn 101, Issue 6, 2012, Pages

  Krylov, Igor ^a   Gavrilov, Arkady ^a   Eizenberg, Moshe ^a   Ritter, Dan ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

AS INTERFACES; GATE STACKS; MID-GAP INTERFACES; OH CONCENTRATION; PRE-DEPOSITION; SURFACE SPECIES; WEAK INVERSIONS; X-RAY PHOTOELECTRON SPECTROSCOPY STUDIES;

ELECTRIC PROPERTIES; PHOTOELECTRONS; SOLID STATE PHYSICS; X RAY PHOTOELECTRON SPECTROSCOPY;

GALLIUM;

EID: 84865127705     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4745012     Document Type: Article

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