Investigation of the structure of fluoroalkylsilanes deposited on alumina surface

Applied Surface Science

Volumn 258, Issue 24, 2012, Pages 9849-9855

  Cichomski, M ^a   Kosla K ^a   Kozlowski W ^a   Szmaja, W ^a   Balcerski, J ^a   Rogowski, J ^b   Grobelny, J ^a  

^a UNIVERSITY OF LODZ   (Poland)

^b LODZ UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Alumina surface; Atomic force microscopy; Fluoroalkylsilanes; Fourier transform infrared spectroscopy; Nanotribology; Time of flight secondary ion mass spectrometry; X ray photoelectron spectroscopy

Indexed keywords

ADHESION; ALUMINA; ATOMIC FORCE MICROSCOPY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; FRICTION; NANOTRIBOLOGY; ORGANIC POLYMERS; PHOTOELECTRONS; PHOTONS; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; SILANES; SURFACE TREATMENT; X RAY PHOTOELECTRON SPECTROSCOPY;

ADHESION MEASUREMENT; ALUMINA SURFACE; COEFFICIENT OF FRICTIONS; FLUOROALKYLSILANES; FOURIER TRANSFORM INFRA RED (FTIR) SPECTROSCOPY; FRICTION COEFFICIENTS; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY; VAPOR PHASE DEPOSITION;

ALUMINUM OXIDE;

EID: 84864683391     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2012.06.040     Document Type: Article

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