Revealing different bonding modes of self-assembled octadecylphosphonic acid monolayers on oxides by time-of-flight secondary ion mass spectrometry: Silicon vs aluminum

Analytical Chemistry

Volumn 82, Issue 8, 2010, Pages 3371-3376

  Nie, Heng Yong ^a  

^a UNIVERSITY OF WESTERN ONTARIO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM FILM; BONDING MODES; CHEMICAL BONDINGS; CHEMICALLY BONDED; ION FRAGMENTS; NATIVE OXIDE LAYER; OCTADECYLPHOSPHONIC ACIDS; OXIDE LAYER; SAMS; SELF-ASSEMBLED; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY; TOF SIMS; WATER MOLECULE;

ACIDS; ALUMINUM; CHEMICAL BONDS; DIMERS; IONS; MOLECULES; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS; SPECTROMETRY;

SELF ASSEMBLED MONOLAYERS;

EID: 77951067522     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac100671q     Document Type: Article

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