High-resolution diffraction microscopy using the plane-wave field of a nearly diffraction limited focused x-ray beam

Physical Review B - Condensed Matter and Materials Physics

Volumn 80, Issue 5, 2009, Pages

  Takahashi, Yukio ^a   Nishino, Yoshinori ^b   Tsutsumi, Ryosuke ^a   Kubo, Hideto ^a   Furukawa, Hayato ^a   Mimura, Hidekazu ^a   Matsuyama, Satoshi ^a   Zettsu, Nobuyuki ^a   Matsubara, Eiichiro ^c   Ishikawa, Tetsuya ^b   Yamauchi, Kazuto ^a  

^a OSAKA UNIVERSITY   (Japan)

^b RIKEN SPring 8 Center ^*  (Japan)

^c KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 70249101729     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.80.054103     Document Type: Article

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