The role of nonlinear dynamics in quantitative atomic force microscopy

Nanotechnology

Volumn 23, Issue 26, 2012, Pages

  Platz, Daniel ^a   Forchheimer, Daniel ^a   Tholén, Erik A ^a   Haviland, David B ^a  

^a ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPE (AFM); CANTILEVER MOTION; FREQUENCY MIXING; FUNDAMENTAL RESONANCE; NARROW BANDS; NON-LINEAR MOTIONS; SIMULATED DATA; TIP-SURFACE INTERACTION;

ATOMIC FORCE MICROSCOPY;

FORCE MEASUREMENT;

EID: 84862638379     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/23/26/265705     Document Type: Review

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