Independently-controlled-gate FinFET schmitt trigger sub-threshold SRAMs

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 20, Issue 7, 2012, Pages 1201-1210

  Hsieh, Chien Yu ^a   Fan, Ming Long ^a   Hu, Vita Pi Ho ^a   Su, Pin ^a   Chuang, Ching Te ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

FinFET; low power SRAM; Schmitt Trigger; static noise margin; sub threshold SRAM

Indexed keywords

FINFET; LOW-POWER SRAM; SCHMITT TRIGGER; STATIC NOISE MARGIN; SUB-THRESHOLD SRAM;

CELLS; CYTOLOGY; FINS (HEAT EXCHANGE); INTEGRATED CIRCUITS; MONTE CARLO METHODS; THREE DIMENSIONAL; THREE DIMENSIONAL COMPUTER GRAPHICS;

STATIC RANDOM ACCESS STORAGE;

EID: 84862014513     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVLSI.2011.2156435     Document Type: Article

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