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Volumn , Issue , 2007, Pages 392-395
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Layout options for stability tuning of SRAM cells in Multi-Gate-FET technologies
a,b a a a b d d c c,d c a a b |
Author keywords
[No Author keywords available]
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Indexed keywords
CORE CELLS;
EUROPEAN;
GATE OXIDES (GOX);
GATE STACKS;
MEASUREMENT RESULTS;
METAL GATES;
SOLID-STATE CIRCUITS CONFERENCE;
SRAM CELLS;
STATIC NOISE;
ARCHITECTURAL DESIGN;
FIELD EFFECT TRANSISTORS;
MESFET DEVICES;
MICROFLUIDICS;
STATIC RANDOM ACCESS STORAGE;
TECHNOLOGY;
CMOS INTEGRATED CIRCUITS;
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EID: 44849084964
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ESSCIRC.2007.4430325 Document Type: Conference Paper |
Times cited : (12)
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References (7)
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