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Volumn 353, Issue 1, 2012, Pages 68-71

Imaging extended non-homogeneities in HVPE grown GaN with Kelvin Probe Microscopy and photo-etching

Author keywords

A1. Atomic force microscopy; A3. Hydride vapor phase epitaxy; B1. Gallium compounds; B1. Nitrides

Indexed keywords

BULK CRYSTALS; BULK GROWTH; ETCH DEPTH; GAN LAYERS; HIGH ELECTRON CONCENTRATION; HYDRIDE VAPOR PHASE EPITAXY; KELVIN PROBE FORCE MICROSCOPY; KELVIN PROBE MICROSCOPY; PHOTO-ETCHING; SAPPHIRE TEMPLATES;

EID: 84861610403     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2012.04.025     Document Type: Article
Times cited : (5)

References (23)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.