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Volumn 353, Issue 1, 2012, Pages 68-71
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Imaging extended non-homogeneities in HVPE grown GaN with Kelvin Probe Microscopy and photo-etching
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Author keywords
A1. Atomic force microscopy; A3. Hydride vapor phase epitaxy; B1. Gallium compounds; B1. Nitrides
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Indexed keywords
BULK CRYSTALS;
BULK GROWTH;
ETCH DEPTH;
GAN LAYERS;
HIGH ELECTRON CONCENTRATION;
HYDRIDE VAPOR PHASE EPITAXY;
KELVIN PROBE FORCE MICROSCOPY;
KELVIN PROBE MICROSCOPY;
PHOTO-ETCHING;
SAPPHIRE TEMPLATES;
ATOMIC FORCE MICROSCOPY;
CARRIER CONCENTRATION;
CRYSTAL IMPURITIES;
ELECTRIC PROPERTIES;
EPITAXIAL GROWTH;
ETCHING;
HYDRATES;
PROBES;
SAPPHIRE;
SURFACE POTENTIAL;
VAPORS;
GALLIUM NITRIDE;
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EID: 84861610403
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2012.04.025 Document Type: Article |
Times cited : (5)
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References (23)
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