In situ resistance measurement of the p -type contact in InP-InGaAsP coolerless ridge waveguide lasers

Applied Physics Letters

Volumn 86, Issue 8, 2005, Pages 1-3

  Kuntze, S B ^a   Sargent, E H ^a   White, J K ^b   Hinzer, K ^b   Dixon Warren, St J ^c   Ban, D ^d  

^a Edward S Rogers Sr Department of Electrical and Computer Engineering   (Canada)

^b Bookham Inc   (Switzerland)

^c Chipworks Inc   (Canada)

^d NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POTENTIAL; FERMI LEVEL; FREQUENCY RESPONSE; HETEROJUNCTIONS; LEAKAGE CURRENTS; LIGHT EMISSION; OPTICAL WAVEGUIDES; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; SEMICONDUCTING INDIUM PHOSPHIDE; THERMIONIC EMISSION;

CONTACT RESISTANCE; LIGHT-EMITTING FACET; RIDGE WAVEGUIDE (RWG); SCANNING VOLTAGE MICROSCOPY (SVM);

SEMICONDUCTOR LASERS;

EID: 17044400236     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1869541     Document Type: Article

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