A novel imaging energy filter for cathode lens electron microscopy

Ultramicroscopy

Volumn 116, Issue , 2012, Pages 95-105

  Grzelakowski, Krzysztof ^a  

^a OPTICON Nanotechnology   (Poland)

Author keywords

Cathode lens; Electron spectromicroscopy; Imaging energy filter; Imaging ESCA; LEEM; PEEM

Indexed keywords

CATHODE LENS; IMAGING ENERGY FILTERS; LEEM; PEEM; SPECTROMICROSCOPY;

ELECTRON MICROSCOPY; SPHERES;

CATHODES;

ANALYTIC METHOD; ANALYZER; ARTICLE; ELECTRIC CONDUCTIVITY; ELECTRON CAPTURE DETECTION; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; EQUIPMENT DESIGN; IMAGE ANALYSIS; IMAGE PROCESSING; IMAGING SYSTEM; LENS; MATHEMATICAL COMPUTING; MOLECULAR IMAGING; PROCESS DESIGN; SIMULATION; SURFACE PROPERTY;

EID: 84860523315     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.03.010     Document Type: Article

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