Novel and traditional fringing field correction schemes for the hemispherical analyser: Comparison of first-order focusing and energy resolution

Measurement Science and Technology

Volumn 18, Issue 7, 2007, Pages 1853-1858

  Sise, Omer ^a   Zouros, T J M ^b,c   Ulu, Melike ^a   Dogan, Mevlut ^a  

^a AFYON KOCATEPE UNIVERSITY   (Turkey)

^b UNIVERSITY OF CRETE   (Greece)

^c INSTITUTE OF ELECTRONIC STRUCTURE AND LASER   (Greece)

Author keywords

Electron optic simulations; Energy resolution; Fringing fields; Herzog; Jost; Paracentric entry; Real apertures; SIMION; Slits

Indexed keywords

COMPUTER SIMULATION; ELECTRODES; FOCUSING; OPTICAL SYSTEMS;

ELECTRON OPTIC SIMULATIONS; ENERGY RESOLUTION; FRINGING FIELDS; PARACENTRIC ENTRY; REAL APERTURES;

MOIRE FRINGES;

COMPUTER SIMULATION; ELECTRODES; FOCUSING; MOIRE FRINGES; OPTICAL SYSTEMS;

EID: 34250710003     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/18/7/009     Document Type: Article

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