Electron optical aspects of the dual-emission electron spectromicroscope

Journal of Physics Condensed Matter

Volumn 17, Issue 16, 2005, Pages

  Grzelakowski, Krzysztof ^a  

^a OPTICON   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; ELECTROMAGNETIC DISPERSION; ELECTRON BEAMS; ELECTRON EMISSION; ELECTRON MICROSCOPES; ELECTRON SPECTROSCOPY; OPTICAL INSTRUMENT LENSES;

DEFLECTOR SYSTEMS; DUAL-EMISSION ELECTRON SPECTROMICROSCOPES (DEEM); ELECTRON OPTICAL IMAGES; RELAY LENSES;

ELECTRON OPTICS;

EID: 24344448264     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/17/16/006     Document Type: Article

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