Fringing field optimization of hemispherical deflector analyzers using BEM and FDM

Journal of Electron Spectroscopy and Related Phenomena

Volumn 177, Issue 1, 2010, Pages 42-51

  Sise, Omer ^a   Ulu, Melike ^a   Dogan, Mevlut ^a   Martinez, Genoveva ^b   Zouros, Theo J M ^c,d  

^a AFYON KOCATEPE UNIVERSITY   (Turkey)

^b UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

^c UNIVERSITY OF CRETE   (Greece)

^d Nuclear Research Center Democritos Tandem Accelerator Laboratory   (Greece)

Author keywords

BEM; Energy resolution; FDM; First order focusing; Fringing fields; Hemispherical deflector analyzers; Paracentric entry; SIMION

Indexed keywords

ENERGY RESOLUTION; ENERGY RESOLUTIONS; FIRST-ORDER; FRINGING FIELDS; HEMISPHERICAL DEFLECTOR ANALYZER;

BOUNDARY ELEMENT METHOD; FREQUENCY DIVISION MULTIPLEXING; NUMERICAL METHODS;

OPTIMIZATION;

EID: 77949317621     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2010.01.003     Document Type: Article

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