Apertureless near-field optical microscopy: Differences between heterodyne interferometric and non-interferometric images

Ultramicroscopy

Volumn 111, Issue 9-10, 2011, Pages 1469-1474

  Esteban, Ruben ^a,b,c   Vogelgesang, Ralf ^a   Kern, Klaus ^a,d  

^a MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

^b DONOSTIA INTERNATIONAL PHYSICS CENTER DIPC   (Spain)

^c UNIV PARIS SUD   (France)

^d EPFL   (Switzerland)

Author keywords

Apertureless near field optical microscopy; Demodulation; Imaging; Interferometry; Simulations

Indexed keywords

APERTURELESS SCANNING; DETECTION SCHEME; IMAGE GENERATIONS; INTERFEROMETRIC DETECTION; NEAR FIELD OPTICAL MICROSCOPY; OPTICAL PHASE; SIMULATIONS;

CHEMICAL DETECTION; DEMODULATION; EXPERIMENTS; HETERODYNING; IMAGING TECHNIQUES; INTERFEROMETRY; OPTICAL DATA STORAGE;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

APERTURELESS SCANNING NEAR FIELD OPTICAL MICROSCOPY; ARTICLE; HETERODYNE INTERFEROMETRIC IMAGE; HETERODYNE NON INTERFEROMETRIC IMAGE; IMAGE ANALYSIS; IMAGE DISPLAY; IMAGE PROCESSING; IMAGING SYSTEM; INTERFEROMETRY; MEASUREMENT; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SIGNAL PROCESSING; SIMULATION;

COMPUTER SIMULATION; EQUIPMENT DESIGN; IMAGE PROCESSING, COMPUTER-ASSISTED; INTERFEROMETRY; MICROSCOPY; MODELS, THEORETICAL; SCATTERING, RADIATION;

EID: 84860409222     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2011.07.003     Document Type: Article

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