An analysis of heterodyne signals in apertureless scanning near-field optical microscopy

Optics Express

Volumn 16, Issue 22, 2008, Pages 17982-18003

  Chuang, Chin Ho ^a   Lo, Yu Lung ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

Apertureless scanning near field optical microscopy; Heterodyne detection

Indexed keywords

ELECTRIC FIELDS; HETERODYNE DETECTION; HETERODYNING; LIGHT SOURCES; OPTICAL DATA STORAGE; OPTICAL HETERODYNING; OPTICAL MICROSCOPY; SCANNING;

APERTURELESS SCANNING; DETECTION SIGNAL; HETERODYNE SIGNALS; HOMODYNE METHODS; INCIDENT ANGLES; INTERFERENCE-BASED MODEL; MODULATION DEPTH; SPECIFIC VALUES;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 55349121529     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.16.017982     Document Type: Article

References (20)

1. E. Betzing and M. Isaacson, "Collection mode near-field scanning optical microscopy," Appl. Phys. Lett. 51, 2088-2090 (1987).
2. E. Betzing, J. K. Trautman, T. D. Harris, J. S. Weiner, and R. L. Kostelak, "Breaking the diffraction barrier-optical microscopy on a nanometric scale," Science 251, 1468-1470 (1991).
3. S. Patane, G. G. Gucciardi, M. Labardi, and M. Allegrini, "Apertureless near-field optical microscopy," Rivita Del Nuovo Cimento 27, 1-46 (2004).
4. J. Wessel, "Surface-enhanced optical microscopy," J. Opt. Soc. Am. 2, 1538-1540 (1985).
5. H. K. Wickramasinghe and C. C. Williams, "Apertureless near field optical microscope," US Patent 4 947 034 (1990).
6. Y. Inouye and S. Kawata, "Near-field scanning optical microscope with a metallic probe tip," Opt. Lett. 19, 159-161 (1994).
7. R. Hillenbrand and F. Keilmann, "Complex optical constants on a subwavelength scale," Phys. Rev. Lett. 85, 3029-3032 (2000).
8. R. Hillenbrand, B. Knoll, and F. Keilmann, "Pure optical contrast in scattering-type scanning near-field microscopy," J. Microsc. 202, 77-83 (2000).
9. B. Knoll and F. Keilmann, "Enhanced dielectric contrast in scattering-type scanning near-field optical microscopy," Opt. Commun. 182, 321-328 (2000).
10. S. Hudlet, S. Aubert, A. Bruyant, R. Bachelot, P. M. Adam, J. L. Bijeon, G. Lerondel, P. Royer, and A. A. Stashkevich, "Apertureless near field optical microscopy: a contribution to the understanding of the signal detected in the presence of background field," Opt. Commun. 230, 245-251 (2004).
11. F. Formanek, Y. D. Wilde, and L. Aigouy, "Analysis of the measured signals in apertureless near-field optical microscopy," Ultramicroscopy 103, 133-139 (2005).
12. P. G. Gucciardi, G. Bachelier, and M. Allegrini, "Far-field background suppression in tip-modulated apertureless near-field optical microscopy," J. Appl. Phys. 99, Art. No. 124309 (2006).
13. P. G. Gucciardi, G. Bachelier, M. Allegrini, J. Ahn, M. Hong, S. Chang, W. Jhe, S. C. Hong, and S. H. Baek, "Artifacts identification in apertureless near-field optical microscopy," J. Appl. Phys. 101, Art. No. 064303 (2007).
14. L. Billot, M. Lamy de la Chapelle, D. Barchiesi, S. H. Chang, S. K. Gray, J. A. Rogers, A. Bouhelier, P. M. Adam, J. L Bijeon, G. P. Wiederrecht, R. Bachelot, and P. Royer, "Error signal artifact in apertureless scanning near-field optical microscopy," Appl. Phys. Lett. 89, Art. No. 023105 (2006).
15. C. H. Chuang and Y. L. Lo, "Analytical Analysis of Modulated Signal in Apertureless Scattering Near-field Optical Microscopy," Opt. Express 15, 15782-15796 (2007).
16. L. Gomez, R. Bachelot, A. Bouhelier, G. P. Wiederrecht, S. Chang, S. K. Gary, F. Hua, S. Jeon, J. A. Rogers, M. E. Castro, S. Blaize, I. Stefanon, G. Lerondel, and P. Royer, "Apertureless scanning near-field optical microscopy: a comparison between homodyne and heterodyne approaches," J. Opt. Soc. Am. B 23, 823-833 (2006).
17. I. Stefanon, S. Blaize, A. Bruyant, S Aubert, G. Lerondel, R. Bachelot, and P. Royer, "Heterodyne detection of guided waves using a scattering-type scanning near-field optical microscope," Opt. Express 13, 5553-5564 (2005).
18. J. N. Walford, J. A. Porto, R. Carminati, J. J. Greffet, P. M. Adam, S. Hudlet, J. L. Bijeon, A. Stashkevich, and P. Royer, "Influence of tip modulation on image formation in scanning near-field optical microscopy," J. Appl. Phys. 89, 5159-5169 (2001).
19. F. Keilmann and R. Hillenbrand, "Near-field microscopy by elastic light scattering from a tip," Phil. Trans. R. Soc. Lond. A. 362, 787-805 (2004).
20. M. Micic, N. Klymyshyn, Y. D. Sun, and H. P. Lu, "Finite element method simulation of the field distribution for AFM tip-enhanced surface Raman Scanning Microscopy," J. Phys. Chem. B. 107, 1574-1584 (2003).