SCOPUS 정보 검색 플랫폼

Volumn 103, Issue 2, 2005, Pages 133-139

Analysis of the measured signals in apertureless near-field optical microscopy

a CNRS (France)

Author keywords

Imaging and optical processing; Near field scanning microscopy

Indexed keywords

ELECTRIC FIELD EFFECTS; ELECTRODYNAMICS; INFRARED RADIATION; LASER BEAMS; LIGHT INTERFERENCE; LIGHT SCATTERING; MATHEMATICAL MODELS;

DIELECTRIC IMAGES; OPTICAL SIGNALS; OSCILLATING TIPS; WAVELENGTH;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

ANALYTIC METHOD; ARTICLE; CALCULATION; DIPOLE; INFRARED RADIATION; LASER; OSCILLATION; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SURFACE PROPERTY;

EID: 14844359985 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/j.ultramic.2004.11.004 Document Type: Article

Times cited : (22)

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