Dielectric contrast imaging using apertureless scanning near-field optical microscopy in the reflection mode

Journal of the Korean Physical Society

Volumn 47, Issue SUPPL. 1, 2005, Pages

  Roy, Debdulal ^a,b   Leong, S H ^a,b   Welland, M E ^a,b  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

Atomic force microscopy; Dielectric; Interferometry; Near field; Scattering

Indexed keywords

EID: 25144454659     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

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