Effect of sample and substrate electric properties on the electric field enhancement at the apex of SPM nanotips

Journal of Physical Chemistry B

Volumn 109, Issue 33, 2005, Pages 15699-15706

  Notingher, Ioan ^a   Elfick, Alistair ^a  

^a UNIVERSITY OF EDINBURGH   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD EFFECTS; ESTIMATION; FINITE ELEMENT METHOD; GOLD; OPTICAL RESOLVING POWER; OPTIMIZATION; PERMITTIVITY; RAMAN SCATTERING; RAMAN SPECTROSCOPY;

ELECTROMAGNETIC COUPLINGS; EXCITATION WAVELENGTH; SPM NANOTIPS; TIP-ENHANCED RAMAN SPECTROSCOPY (TERS);

NANOSTRUCTURED MATERIALS;

ALGORITHM; ARTICLE; COMPUTER SIMULATION; ELECTRIC CAPACITANCE; EQUIPMENT DESIGN; IMPEDANCE; INSTRUMENTATION; METHODOLOGY; NANOTECHNOLOGY; RADIATION SCATTERING; RAMAN SPECTROMETRY; SCANNING PROBE MICROSCOPY;

ALGORITHMS; COMPUTER SIMULATION; ELECTRIC CAPACITANCE; ELECTRIC IMPEDANCE; EQUIPMENT DESIGN; MICROSCOPY, SCANNING PROBE; NANOTECHNOLOGY; SCATTERING, RADIATION; SPECTRUM ANALYSIS, RAMAN;

EID: 24944563785     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp0523120     Document Type: Article

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