Frequency response of higher cantilever eigenmodes in bimodal and trimodal tapping mode atomic force microscopy

Measurement Science and Technology

Volumn 21, Issue 12, 2010, Pages

  Solares, Santiago D ^a   Chawla, Gaurav ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

AM AFM; Amplitude modulation; Dynamic atomic force microscopy; FM AFM; Frequency modulation; Multi frequency; Multimode; Phase locked loop; PLL; Spectroscopy

Indexed keywords

AMPLITUDE MODULATION; FREQUENCY MODULATION; FREQUENCY RESPONSE; FREQUENCY SHIFT KEYING; MODULATION; NANOCANTILEVERS; PHASE LOCKED LOOPS; SPECTROSCOPY;

DISSIPATIVE FORCES; DYNAMIC ATOMIC FORCE MICROSCOPY; IMAGING SCHEMES; MULTI FREQUENCY; MULTIMODES; OSCILLATION AMPLITUDE; POTENTIAL IMAGING; TAPPING-MODE ATOMIC FORCE MICROSCOPY;

ATOMIC FORCE MICROSCOPY;

EID: 78649819702     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/21/12/125502     Document Type: Article

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