Determination and simulation of nanoscale energy dissipation processes in amplitude modulation AFM

Ultramicroscopy

Volumn 110, Issue 6, 2010, Pages 626-633

  Gomez Carlos J C J ^a   Garcia, Ricardo ^a  

^a INSTITUTO DE MICROELECTRÓNICA DE MADRID   (Spain)

Author keywords

Amplitude modulation AFM; Energy dissipation; Force microscopy; Phase imaging AFM

Indexed keywords

AFM; AMPLITUDE MODULATION AFM; DISSIPATED ENERGY; DISSIPATIVE PROCESS; EXPERIMENTAL PARAMETERS; FORCE MICROSCOPY; INTERFACIAL INTERACTION; MAXIMUM VALUES; NANO SCALE; PHASE IMAGING; QUALITY FACTORS; SURFACE ADHESION; THEORETICAL FRAMEWORK;

AMPLITUDE MODULATION; ASPHALT PAVEMENTS; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY DISSIPATION; ENERGY DISSIPATORS; NANOSTRUCTURED MATERIALS;

ATOMIC FORCE MICROSCOPY;

ADHESION; ALGORITHM; ANALYTIC METHOD; ARTICLE; ATOMIC FORCE MICROSCOPY; CALCULATION; HYDRODYNAMICS; SIMULATION; SURFACE PROPERTY; VISCOELASTICITY;

EID: 77953534668     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2010.02.023     Document Type: Article

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