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Journal of Applied Physics

Volumn 108, Issue 9, 2010, Pages

Phase image contrast mechanism in intermittent contact atomic force microscopy

(4) Zhao, Yagun a Cheng, Qian a Qian, Menglu a Cantrell, John H b

a TONGJI UNIVERSITY (China)

b NASA LANGLEY RESEARCH CENTER (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; CANTILEVER OSCILLATION; CANTILEVER TIP; CONSERVATIVE FORCE; CONSTANT AMPLITUDE; DISSIPATIVE FORCES; INDENTATION DEPTH; INTERMITTENT CONTACT ATOMIC FORCE MICROSCOPIES; MODEL EQUATIONS; MODEL PREDICTION; NANOCOMPOSITE SAMPLES; PHASE CONTRASTS; PHASE IMAGE; PHASE VARIATION; SAMPLE SURFACE; TAPPING MODES; TIP-SAMPLE CONTACT; TWO-POINT;

GRAPHITE; NANOCANTILEVERS; NANOCOMPOSITES; PHASE SHIFT; POROSITY; SEMICONDUCTOR DEVICE STRUCTURES;

ATOMIC FORCE MICROSCOPY;

EID: 78649272749 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3503478 Document Type: Article

Times cited : (21)

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