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Volumn 108, Issue 9, 2010, Pages

Phase image contrast mechanism in intermittent contact atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

AFM; CANTILEVER OSCILLATION; CANTILEVER TIP; CONSERVATIVE FORCE; CONSTANT AMPLITUDE; DISSIPATIVE FORCES; INDENTATION DEPTH; INTERMITTENT CONTACT ATOMIC FORCE MICROSCOPIES; MODEL EQUATIONS; MODEL PREDICTION; NANOCOMPOSITE SAMPLES; PHASE CONTRASTS; PHASE IMAGE; PHASE VARIATION; SAMPLE SURFACE; TAPPING MODES; TIP-SAMPLE CONTACT; TWO-POINT;

EID: 78649272749     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3503478     Document Type: Article
Times cited : (21)

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