Nanoscale measurement of the power spectral density of surface roughness: How to solve a difficult experimental challenge

Nanoscale Research Letters

Volumn 7, Issue , 2012, Pages 1-33

  Martínez, Juan Francisco González ^a   Nieto Carvajal, Inés ^a   Abad, José ^a   Colchero, Jaime ^a  

^a UNIVERSITY OF MURCIA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR SIGNAL; EXPERIMENTAL DATA; EXPERIMENTAL PARAMETERS; FEED-BACK LOOP; FEEDBACK PARAMETERS; FEEDBACK RESPONSE; LOW-PASS FILTERING; NANO-SCALE MEASUREMENTS; POWER SPECTRAL DENSITIES (PSD); TOPOGRAPHIC IMAGES; TOPOGRAPHY IMAGES;

POWER SPECTRAL DENSITY; SCANNING TUNNELING MICROSCOPY; SURFACE MORPHOLOGY; SURFACE ROUGHNESS; TOPOGRAPHY;

QUALITY CONTROL;

EID: 84859400700     PISSN: 19317573     EISSN: 1556276X     Source Type: Journal    
DOI: 10.1186/1556-276X-7-1     Document Type: Article

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