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Volumn 5188, Issue , 2003, Pages 246-253

Characterization procedures for nanorough ultra-hydrophobic surfaces with controlled optical scatter

Author keywords

Light scattering; Nanostructures; Optical appearance; Roughness; Thin film coatings; Visual inspection

Indexed keywords

DENSITY (OPTICAL); HYDROPHOBICITY; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; OPTICAL COATINGS; OPTICAL GLASS; SURFACE ROUGHNESS; THIN FILMS;

EID: 2342526601     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.505599     Document Type: Conference Paper
Times cited : (9)

References (6)
  • 2
    • 0036602879 scopus 로고    scopus 로고
    • Optical coatings with enhanced roughness for ultrahydrophobic, low scatter applications
    • A. Duparré, M. Flemming, J. Steinert, K. Reihs, "Optical coatings with enhanced roughness for ultrahydrophobic, low scatter applications", Appl. Optics 41, pp. 3294-3298, 2002.
    • (2002) Appl. Optics , vol.41 , pp. 3294-3298
    • Duparré, A.1    Flemming, M.2    Steinert, J.3    Reihs, K.4
  • 3
    • 85010168367 scopus 로고    scopus 로고
    • Multi-type surface and thin film characterization using light scattering, scanning force microscopy and white light interferometry
    • Optical metrology, G. A. Al-Jumaily, ed., SPIE Bellingham, Wash.
    • A. Duparré, G. Notni, "Multi-type surface and thin film characterization using light scattering, scanning force microscopy and white light interferometry.", in Optical metrology, G. A. Al-Jumaily, ed., SPIE Critical Revue Series, vol. CR 72, pp. 213-223, SPIE Bellingham, Wash., 1999.
    • (1999) SPIE Critical Revue Series , vol.CR 72 , pp. 213-223
    • Duparré, A.1    Notni, G.2
  • 4
    • 0005997281 scopus 로고    scopus 로고
    • Roughness and light scattering of ion-beam-sputtered fluoride coatings for 193nm
    • J. Ferré-Borrull, A. Duparré, E. Quesnel, "Roughness and light scattering of ion-beam-sputtered fluoride coatings for 193nm", Appl. Optics 39, pp. 5854-5864, 2000.
    • (2000) Appl. Optics , vol.39 , pp. 5854-5864
    • Ferré-Borrull, J.1    Duparré, A.2    Quesnel, E.3
  • 5
    • 0036285061 scopus 로고    scopus 로고
    • Surface characterization techniques for determining root-mean-square roughness and power spectral densities of optical components
    • A. Duparré, J. Ferré-Borrull, S. Gliech, G. Notni, J. Steinert, J. M. Bennett, "Surface characterization techniques for determining root-mean-square roughness and power spectral densities of optical components", Appl. Optics 41, pp. 154-171, 2002.
    • (2002) Appl. Optics , vol.41 , pp. 154-171
    • Duparré, A.1    Ferré-Borrull, J.2    Gliech, S.3    Notni, G.4    Steinert, J.5    Bennett, J.M.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.