SCOPUS 정보 검색 플랫폼

Volumn 33, Issue 2, 2002, Pages 92-95

Extending the capabilities of scanning probe microscopy for microroughness analysis in surface engineering

(3) Ferr Borrull, Josep a Steinert, Jörg a Duparr, Angela a

a FRAUNHOFER INSTITUTE FOR APPLIED OPTICS AND PRECISION ENGINEERING (Germany)

Author keywords

Roughness analysis; Scanning force microscopy; Surface measurements; Surface quality; Thin films; White light interferometry

Indexed keywords

ATOMIC FORCE MICROSCOPY; FRICTION; GOLD; INTERFEROMETRY; LIGHT SCATTERING; MICROSTRUCTURE; ROUGHNESS MEASUREMENT; SURFACE PROPERTIES; SURFACE TENSION; THIN FILMS; TITANIUM NITRIDE; WETTING;

FRICTION COEFFICIENT; MICROROUGHNESS ANALYSIS; POWER SPECTRAL DENSITY; SCANNING PROBE MICROSCOPY; SURFACE MICROSTRUCTURE; WETTING ANGLE;

SURFACE ROUGHNESS;

EID: 0036472231 PISSN: 01422421 EISSN: None Source Type: Journal
DOI: 10.1002/sia.1169 Document Type: Article

Times cited : (10)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.