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Nanoscale Research Letters

Volumn 4, Issue 3, 2009, Pages 262-268

Atomic force microscopy study of the kinetic roughening in nanostructured gold films on SiO 2

(5) Ruffino, F a Grimaldi, M G a Giannazzo, F b Roccaforte, F b Raineri, V b

a UNIVERSITY OF CATANIA (Italy)

b CNR (Italy)

Author keywords

Atomic force microscopy; Dynamic scaling behavior; Gold; Kinetic roughening; SiO 2

Indexed keywords

AU FILMS; CORRELATION LENGTHS; DYNAMIC SCALING BEHAVIOR; GRAIN-BOUNDARY DIFFUSIONS; GROWTH EXPONENTS; GROWTH PROCESS; KINETIC ROUGHENING; NANOSTRUCTURED GOLDS; ROOM TEMPERATURES; ROUGHNESS EXPONENTS; SIO 2; SPUTTERING DEPOSITIONS;

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; FILM GROWTH; GOLD DEPOSITS; GRAIN BOUNDARIES; GRAIN GROWTH; GROWTH (MATERIALS); SCALING LAWS; SILICON COMPOUNDS; SURFACE ROUGHNESS;

GOLD;

EID: 59949098678 PISSN: 19317573 EISSN: 1556276X Source Type: Journal
DOI: 10.1007/s11671-008-9235-0 Document Type: Article

Times cited : (41)

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