Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy

Beilstein Journal of Nanotechnology

Volumn 3, Issue 1, 2012, Pages 238-248

  Welker, Joachim ^a   Illek, Esther ^a   Giessibl, Franz J ^a  

^a UNIVERSITY OF REGENSBURG   (Germany)

Author keywords

Force deconvolution; Frequency modulation atomic force microscopy; Numerical implementation

Indexed keywords

AMPLITUDE DEPENDENCE; DECAY LENGTH; DECONVOLUTION ALGORITHM; DECONVOLUTION METHOD; DIRECT MEASURES; FORCE FIELDS; FREQUENCY MODULATION ATOMIC FORCE MICROSCOPY; FREQUENCY SHIFT; MATRIX METHODS; NON-TRIVIAL DEPENDENCE; NUMERICAL IMPLEMENTATION; OSCILLATING CANTILEVER; OSCILLATION AMPLITUDE;

ATOMIC FORCE MICROSCOPY; DECONVOLUTION; FREQUENCY SHIFT KEYING;

NUMERICAL METHODS;

EID: 84858392337     PISSN: None     EISSN: 21904286     Source Type: Journal    
DOI: 10.3762/bjnano.3.27     Document Type: Article

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