qPlus magnetic force microscopy in frequencymodulation mode with millihertz resolution

Beilstein Journal of Nanotechnology

Volumn 3, Issue 1, 2012, Pages 174-178

  Schneiderbauer, Maximilian ^a   Wastl, Daniel ^a   Giessibl, Franz J ^a  

^a UNIVERSITY OF REGENSBURG   (Germany)

Author keywords

Hard disc; High stiffness cantilever; Magnetic force microscopy; qPlus

Indexed keywords

ATOMIC INTERACTIONS; ATOMIC MAGNETIC MOMENT; DIPOLE FORCES; DOMAIN STRUCTURE; FORCE GRADIENTS; HARD DISC; HIGH-STIFFNESS CANTILEVER; MAGNETIC DIPOLE INTERACTION; MAGNETIC DIPOLE-DIPOLE INTERACTION; MAGNETIC PROBES; MAGNETIC SAMPLES; ORDERS OF MAGNITUDE; QPLUS; SENSING TECHNIQUES; SINGLE PROBE;

ATOMIC FORCE MICROSCOPY; MAGNETIC MOMENTS; PROBES; SCANNING TUNNELING MICROSCOPY; SENSORS; STIFFNESS;

MAGNETIC FORCE MICROSCOPY;

EID: 84858374399     PISSN: None     EISSN: 21904286     Source Type: Journal    
DOI: 10.3762/bjnano.3.18     Document Type: Letter

References (22)

1. Binnig, G.; Rohrer, H.; Gerber, C.; Weibel, E. Phys. Rev. Lett. 1982, 49, 57-61.
2. Binnig, G.; Quate, C. F.; Gerber, C. Phys. Rev. Lett. 1986, 56, 930-933.
3. Wiesendanger, R.; Güntherodt, H.-J.; Güntherodt, G.; Gambino, R. J. Ruf, R. Phys. Rev. Lett. 1990, 65, 247-250.
4. Wiesendanger, R. Rev. Mod. Phys. 2009, 81, 1495-1550.
5. Kaiser, U.; Schwarz, A.; Wiesendanger, R. Nature 2007, 446, 522-525.
6. Martin, Y.; Wickramasinghe, H. K. Appl. Phys. Lett. 1987, 50, 1455-1457.
7. Saénz, J. J.; García, N.; Grütter, P.; Meyer, E.; Heinzelmann, H.; Wiesendanger, R.; Rosenthaler, L.; Hidber, H. R.; Güntherodt, H.-J. J. Appl. Phys. 1987, 62, 4293-4295.
8. Giessibl, F. J. Appl. Phys. Lett. 2000, 76, 1470-1472.
9. Giessibl, F. J.; Hembacher, S.; Bielefeldt, H.; Mannhart, J. Science 2000, 289, 422-425.
10. Giessibl, F. J. Principle of NC-AFM. In Noncontact Atomic Force Microscopy; Morita, S.; Wiesendanger, R.; Meyer, E., Eds.; Springer: Berlin, 2002; Vol. 2, pp 11-46. Chapter 2.
11. Todorovic, M.; Schultz, S. J. Appl. Phys. 1998, 83, 6229-6231.
12. Kim, K.; Seo, Y.; Jang, H.; Chang, S.; Hong, M.-H.; Jhe, W. Nanotechnology 2006, 17, S201-S204.
13. Albrecht, T. R.; Grütter, P.; Horne, D.; Rugar, D. J. Appl. Phys. 1991, 69, 668-673.
14. Kobayashi, K.; Yamada, H.; Matsushige, K. Rev. Sci. Instrum. 2009, 80, 043708.
15. Giessibl, F. J.; Bielefeldt, H.; Hembacher, S.; Mannhart, J. Appl. Surf. Sci. 1999, 140, 352-357.
16. Park, S.-I.; Quate, C. F. Rev. Sci. Instrum. 1987, 58, 2004-2009.
17. NANONIS, SPECS Zurich GmbH, Zurich, Switzerland. http://www.specs-zurich.com.
18. Hartmann, U. Annu. Rev. Mater. Sci. 1999, 29, 53-87.
19. Rozhok, S.; Chandrasekhar, V. Solid State Commun. 2002, 121, 683-686.
20. Seo, Y.; Cadden-Zimansky, P.; Chandrasekhar, V. Appl. Phys. Lett. 2005, 87, 103103.
21. Callaghan, F. D.; Yu, X.; Mellor, C. J. Appl. Phys. Lett. 2005, 87, 214106.
22. Schwarz, A.; Liebmann, M.; Kaiser, U.; Wiesendanger, R.; Noh, T. W.; Kim, D. W. Phys. Rev. Lett. 2004, 92, 077206.