Performance and early applications of a versatile double aberration-corrected JEOL-2200FS FEG TEM/STEM at Aalto University

Micron

Volumn 43, Issue 4, 2012, Pages 545-550

  Jiang, Hua ^a   Ruokolainen, Janne ^a   Young, Neil ^b   Oikawa, Tetsuo ^c   Nasibulin, Albert G ^a   Kirkland, Angus ^b   Kauppinen, Esko I ^a  

^a AALTO UNIVERSITY   (Finland)

^b UNIVERSITY OF OXFORD   (United Kingdom)

^c JEOL   (France)

Author keywords

80kV; Carbon nanotubes; Electron diffraction; Single gold atom detection; Spherical aberration correction; TEM STEM

Indexed keywords

80KV; ABERRATION CORRECTORS; ACCELERATION VOLTAGES; CARBON MATERIAL; CARBON-BASED; CARBON-BASED NANOSTRUCTURES; CHIRAL STRUCTURES; DOUBLE-WALLED CARBON NANOTUBES; FIELD EMISSION GUNS; GOLD ATOMS; HIGH QUALITY; HIGH-ANGLE ANNULAR DARK FIELDS; IMAGING PERFORMANCE; INTERLAYER SPACINGS; PRIMARY ELECTRON BEAMS; SINGLE GOLD ATOM DETECTION; SPHERICAL ABERRATION CORRECTION; TEM IMAGES; TEM/STEM; TRANSMISSION ELECTRON MICROSCOPE;

CARBON; DIFFRACTION PATTERNS; ELECTRON BEAMS; ELECTRON DIFFRACTION; GOLD; IMAGING TECHNIQUES; INTERFEROMETRY; PROBES; TRANSMISSION ELECTRON MICROSCOPY;

CARBON NANOTUBES;

EID: 84857356945     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2011.10.004     Document Type: Article

References (27)

1. Allard L.F., Blom D.A., O'Keefe M.A., Kiely C., Ackland D., Watanabe M., Kawasaki M., Kaneyama T., Sawada H. First results from the aberration-corrected JEOL 2200FS-AC STEM/TEM. Microscopy and Microanalysis 2004, 10:110-111.
2. Anisimov A.S., Nasibulin A.G., Jiang H., Launois P., Cambedouzou J., Shandakov S.D., Kauppinen E.I. Mechanistic investigations of single-walled carbon nanotube synthesis by ferrocene vapor decomposition in carbon monoxide. Carbon 2010, 48:380-388.
3. Batson P.E., Dellby N., Krivanek O.L. Sub-ångstrom resolution using aberration corrected electron optics. Nature 2002, 418:617-620.
4. Blom D.A., Allard L.F., Mishina S., O'Keefe M.A. Early results from an aberration-corrected JEOL 2200FS STEM/TEM at Oak Ridge National Laboratory. Microscopy and Microanalysis 2006, 12:483-491.
5. Gao M., Zuo J.M., Twesten R.D., Petrov I., Nagahara L.A., Zhang R. Structure determination of individual single-wall carbon nanotubes by nanoarea electron diffraction. Applied Physics Letters 2003, 82:2703-2705.
6. Haider M., Rose H., Uhlemann S., Schwan E., Kabius B., Urban K. A spherical-aberration-corrected 200kV transmission electron microscope. Ultramicroscopy 1998, 75:53-60.
7. Haider M., Uhlemann S., Schwan E., Rose G., Kabius B., Urban K. Electron microscopy image enhanced. Nature 1998, 392:768-769.
8. Hashimoto A., Suenaga K., Gloter A., Urita K., Iijima S. Direct evidence for atomic defects in graphene layers. Nature 2004, 430:870-873.
9. Hirahara K., Saitoh K., Yamasaki J., Tanaka N. Direct observation of six-membered rings in the upper and lower walls of a single-wall carbon nanotube by spherical aberration-corrected HRTEM. Nano Letters 2006, 6:1778-1783.
10. Hutchison J.L., Titchmarsh J.M., Cockayne D.J.H., Doole R.C., Hetherington C.J.D., Kirkland A.I., Sawada H. A versatile double aberration-corrected, energy filtered HREM/STEM for materials science. Ultramicroscopy 2005, 103:7-15.
11. Jiang H., Brown D.P., Nasibulin A.G., Kauppinen E.I. Robust Bessel-function-based method for determination of the (n,m) indices of single-walled carbon nanotubes by electron diffraction. Physical Review B - Condensed Matter and Materials Physics 2006, 74:035427.
12. Jiang H., Brown D.P., Nikolaev P., Nasibulin A.G., Kauppinen E.I. Determination of helicities in unidirectional assemblies of graphitic or graphiticlike tubular structures. Applied Physics Letters 2008, 93:141903.
13. Jiang H., Nasibulin A.G., Brown D.P., Kauppinen E.I. Unambiguous atomic structural determination of single-walled carbon nanotubes by electron diffraction. Carbon 2007, 45:662-667.
14. Kirkland A., Chang L.Y., Haigh S., Hetherington C. Transmission electron microscopy without aberrations: applications to materials science. Current Applied Physics 2008, 8:425-428.
15. Kociak M., Suenaga K., Hirahara K., Saito Y., Nakahira T., Iijima S. Linking chiral indices and transport properties of double-walled carbon nanotubes. Physical Review Letters 2002, 89:155501-155504.
16. Krivanek O.L., Chisholm M.F., Nicolosi V., Pennycook T.J., Corbin G.J., Dellby N., Murfitt M.F., Own C.S., Szilagyi Z.S., Oxley M.P., Pantelides S.T., Pennycook S.J. Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy. Nature 2010, 464:571-574.
17. Lin J.A., Cowley J.M. Calibration of the operating parameters for an HB5 stem instrument. Ultramicroscopy 1986, 19:31-42.
18. Nellist P.D., Pennycook S.J. Direct imaging of the atomic configuration of ultradispersed catalysts. Science 1996, 274:413-415.
19. Qin C., Peng L.M. Measurement accuracy of the diameter of a carbon nanotube from TEM images. Physical Review B - Condensed Matter and Materials Physics 2002, 65:1554311-1554317.
20. Sawada H., Tomita T., Naruse M., Honda T., Hambridge P., Hartel P., Haider M., Hetherington C., Doole R., Kirkland A., Hutchison J., Titchmarsh J., Cockayne D. Experimental evaluation of a spherical aberration-corrected TEM and STEM. Journal of Electron Microscopy 2005, 54:119-121.
21. Smith D.J. Progress and perspectives for atomic-resolution electron microscopy. Ultramicroscopy 2008, 108:159-166.
22. Tanaka N. Present status and future prospects of spherical aberration corrected TEM/STEM for study of nanomaterials. Science and Technology of Advanced Materials 2008, 9:014111.
23. Warner J.H., Schäffel F., Zhong G., Rümmeli M.H., Büchner B., Robertson J., Briggs G.A.D. Investigating the diameter-dependent stability of single-walled carbon nanotubes. ACS Nano 2009, 3:1557-1563.
24. Young N.P., Li Z.Y., Chen Y., Palomba S., Di Vece M., Palmer R.E. Weighing supported nanoparticles: size-selected clusters as mass standards in nanometrology. Physical Review Letters 2008, 101:246103.
25. Zhu Y., Wall J. Chapter 12 Aberration-corrected electron microscopes at Brookhaven National Laboratory. Advances in Imaging and Electron Physics 2008, 481-523.
26. Zobelli A., Gloter A., Ewels C.P., Seifert G., Colliex C. Electron knock-on cross section of carbon and boron nitride nanotubes. Physical Review B - Condensed Matter and Materials Physics 2007, 7:5.
27. Zuo J.M., Vartanyants I., Gao M., Zhang R., Nagahara L.A. Atomic resolution imaging of a carbon nanotube from diffraction intensities. Science 2003, 300:1419-1421.