First results from the aberration-corrected JEOL 2200FS-AC STEM/TEM

Microscopy and Microanalysis

Volumn 10, Issue SUPPL. 2, 2004, Pages 110-111

  Allard, L F ^a   Blom, D A ^a   O'Keefe, M A ^b   Kiely, C ^c   Ackland, D ^c   Watanabe, M ^c   Kawasaki, M ^d   Kaneyama, T ^e   Sawada, H ^e  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b Materials Sciences Division   (United States)

^c Lehigh University   (United States)

^d JEOL USA Ltd   (United States)

^e JEOL LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4544376979     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927604882990     Document Type: Conference Paper

References (5)

1. J.L. Hutchison et al., JEOL News 37E (2002) 2-5.
2. W.M.J. Coene, A. Thust, M. Op de Beeck & D. Van Dyck, Ultramicroscopy 64 (1996) 109.
3. M.A. O'Keefe et al., Ultramicroscopy 89 (2001) 4: 215-241.
4. M.A. O'Keefe, Microscopy & Microanalysis 7, 2: (2001) 916.
5. Supported by Director, Office of Science, Office of Basic Energy Sciences, Materials Science Division, DOE (contract DE-AC03-76SF00098), and Asst. Sec. for EERE, Office of FreedomCAR and Vehicle Tech., HTML User Program, ORNL, managed by UT-Battelle, LLC for DOE (contract DE-AC05-00OR22725), and National Science Foundation, Division of Materials Sciences #9626279.