Robust Bessel-function-based method for determination of the (n,m) indices of single-walled carbon nanotubes by electron diffraction

Physical Review B - Condensed Matter and Materials Physics

Volumn 74, Issue 3, 2006, Pages

  Jiang, Hua ^a   Brown, David P ^b   Nasibulin, Albert G ^b   Kauppinen, Esko I ^a,b  

^a VTT TECHNICAL RESEARCH CENTRE OF FINLAND   (Finland)

^b AALTO UNIVERSITY   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33746436649     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.74.035427     Document Type: Article

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