Linking chiral indices and transport properties of double-walled carbon nanotubes

Physical Review Letters

Volumn 89, Issue 15, 2002, Pages 155501/1-155501/4

  Kociak, M ^a   Suenaga, K ^a,b   Hirahara, K ^a   Saito, Y ^c   Nakahira, T ^c   Iijima, S ^a,b  

^a MEIJO UNIVERSITY   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^c MIE UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BESSEL FUNCTIONS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC ARCS; ELECTRON BEAMS; ELECTRON DIFFRACTION; ELECTRONIC DENSITY OF STATES; FERMI LEVEL; HYDROGEN; SIGNAL TO NOISE RATIO; SOOT; TRANSMISSION ELECTRON MICROSCOPY; TRANSPORT PROPERTIES;

CHIRAL INDICES; DOUBLE WALLED CARBON NANOTUBES; SELECTED AREA ELECTRON DIFFRACTION;

CARBON NANOTUBES;

EID: 0037037984     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.89.155501     Document Type: Article

References (23)

1. S. Iijima, Nature (London) 354, 56 (1991).
2. N. Hamada, S. I. Sawada, and A. Oshiyama, Phys. Rev. Lett. 68, 1579 (1992).
3. R. Saito, G. Dresselhaus, and M. S. Dresselhaus, Physical Properties of Carbon Nanotubes (Imperial College Press, London, 1998), Chap. 4.
4. J. W. G. Wildoer, L. C. Venema, A. G. Rinzler, R. E. Smalley, and C. Dekker, Nature (London) 391, 59 (1998).
5. T.W. Odom, J.-L. Huang, P. Kim, and C. M. Lieber, Nature (London) 391, 62 (1998).
6. P. G. Collins, M. S. Arnold, and Ph. Avouris, Science 292, 706 (2001).
7. M. Kruger, M. R. Buitelaar, T. Nussbaumer, C. Schonenberger, and L. Forro, Appl. Phys. Lett. 78, 1291 (2001).
8. M. S. Fuhrer, J. Nygard, L. Shih, M. Forero, Y.-G. Yoon, M. S. Mazzoni, H. J. Choi, J. Ihm, S. G. Louie, A. Zettl and P. McEuen, Science 288, 494 (2000).
9. P. McEuen, M. Bockrath, D. H. Cobden, Y.-G. Yoon, and S. G. Louie, Phys. Rev. Lett. 83, 5098 (1999).
10. H. Ohnishi, Y. Kondo, and K. Takayanagi, Nature (London) 395, 780 (1998).
11. Z. L. Wang, P. Poncharal, and W. A. de Heer, J. Phys. Chem. Solids 61, 1025 (2000).
12. S. Iijima and T. Ichihashi, Nature (London) 363, 603 (1993).
13. L.-C. Qin, in Progress in Transmission Electron Microscopy 2, Applications in Materials Science, Springer Series in Surface Sciences Vol. 39, edited by X. F. Zhang and Z. Zhang (Springer-Verlag/TUP, Berlin, Heidelberg, 2001), pp. 73-104.
14. J.-F. Colomer, L. Henrard, Ph. Lambin, and G. Van Tendeloo, Phys. Rev. B 64, 125425 (2001).
15. S. Amelincx, A. Lucas, and P. Lambin, Rep. Prog. Phys. 62, 1471 (1992).
16. Ph. Lambin and A. A. Lucas, Phys. Rev. B 56, 3571 (1997).
17. K. Hirahara, S. Bandow, M. Kociak, M. Yudasaka, T. Nakahira, K. Itoh, Y. Saito, and S. Iijima (unpublished).
18. V. Meunier and Ph. Lambin, Phys. Rev. Lett. 81, 5588 (1998).
19. A. A. Odintsov, Phys. Rev. Lett. 85, 150 (2000).
20. M. Kociak, Ph.D. thesis, Paris-sud University, 2001.
21. M. Kociak, A. Yu. Kasumov, S. Guéron, B. Reulet, I. I. Khodos, Yu. B. Gorbatov, V. T. Volkov, L. Vaccarini, and H. Bouchiat, Phys. Rev. Lett. 86, 2416 (2001).
22. M. Kociak, O. Stéphan, L. Henrard, V. Charbois, A. Rothschild, R. Tenne, and C. Colliex, Phys. Rev. Lett. 87, 075501 (2001).
23. A. Jorio, R. Saito, J. H. Hafner, C. M. Lieber, G. Dresselhaus, and M. S. Dresselhaus, Phys. Rev. Lett. 86, 1118 (2001).