Structural characterization of graphene grown by thermal decomposition of off-axis 4H-SiC (0001)

Materials Science Forum

Volumn 711, Issue , 2012, Pages 141-148

  Giannazzo, Filippo ^a   Rambach, Martin ^b   Lerch, Wilfried ^b   Bongiorno, Corrado ^a   Di Franco, Salvatore ^a   Rimini, Emanuele ^a   Raineri, Vito ^a  

^a CNR IMM   (Italy)

^b Centrotherm Thermal Solutions GmbH + Co KG   (Germany)

Author keywords

Atomic force microscopy; Graphene; Silicon carbide; Transmission electron microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL ATOMIC STRUCTURE; DECOMPOSITION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; SEMICONDUCTOR DEVICES; SILICON CARBIDE; THERMOLYSIS; TRANSMISSION ELECTRON MICROSCOPY; WIDE BAND GAP SEMICONDUCTORS;

GRAPHENE LAYERS; NANO SCALE; OFF-AXIS; STRUCTURAL CHARACTERIZATION;

GRAPHENE;

EID: 84856953900     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/MSF.711.141     Document Type: Conference Paper

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