Electron microscopy analyses of natural and highly oriented pyrolytic graphites and the mechanically exfoliated graphenes produced from them

Carbon

Volumn 48, Issue 3, 2010, Pages 797-804

  Park, SeongYong ^a   Floresca, Herman C ^a   Suh, YoungJoon ^a   Kim, Moon J ^a  

^a The University of Texas at Dallas   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONTRAST-ENHANCED; CROSS SECTION TEM; DUAL BEAM; ELECTRON MICROSCOPY ANALYSIS; GRAPHENES; HIGHLY ORDERED PYROLYTIC GRAPHITES; HIGHLY ORIENTED PYROLYTIC GRAPHITE; INTENSITY RATIO; NATURAL GRAPHITE; NUMBER OF LAYERS; STACKING SEQUENCE; SUSPENDED MEMBRANES; TEM;

DIFFRACTION; DYNAMIC POSITIONING; HOLOGRAPHIC INTERFEROMETRY; MONOLAYERS; PERCOLATION (SOLID STATE); TRANSMISSION ELECTRON MICROSCOPY;

GRAPHITE;

EID: 71649105462     PISSN: 00086223     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.carbon.2009.10.030     Document Type: Article

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