On the roughness of single- and bi-layer graphene membranes

Solid State Communications

Volumn 143, Issue 1-2, 2007, Pages 101-109

  Meyer, J C ^a,b   Geim, A K ^c   Katsnelson, M I ^d   Novoselov, K S ^c   Obergfell, D ^e   Roth, S ^e   Girit, C ^a,b   Zettl, A ^a,b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF MANCHESTER   (United Kingdom)

^d RADBOUD UNIVERSITY NIJMEGEN   (Netherlands)

^e MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

Author keywords

A. Thin films; B. Nanofabrication; C. Transmission electron microscopy; D. Mechanical properties

Indexed keywords

ELECTRON DIFFRACTION; GRAPHITE; MECHANICAL PROPERTIES; NANOTECHNOLOGY; SURFACE ROUGHNESS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

CARBON ATOMS; GRAPHENE MEMBRANES; RANDOM MICROSCOPIC CURVATURE;

MEMBRANES;

EID: 34249889913     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2007.02.047     Document Type: Article

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