Surface corrugation and stacking misorientation in multilayers of graphene on nickel

Solid State Phenomena

Volumn 178-179, Issue , 2011, Pages 125-129

  Raineri, Vito ^a   Bongiorno, Corrado ^a   Di Franco, Salvatore ^a   Lo Nigro, Raffaella ^a   Rimini, Emanuele ^a   Giannazzo, Filippo ^a  

^a CNR IMM   (Italy)

Author keywords

Atomic force microscopy; Graphene; Nickel; Transmission electron microscopy

Indexed keywords

AMORPHOUS CARBON; AMORPHOUS FILMS; ATOMIC FORCE MICROSCOPY; CARBON FILMS; MULTILAYERS; NICKEL; RAMAN SPECTROSCOPY; RAPID THERMAL PROCESSING; SEMICONDUCTOR DEVICE MANUFACTURE; SURFACE SEGREGATION; TRANSMISSION ELECTRON MICROSCOPY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

AMORPHOUS CARBON (A-C); FILM FORMATIONS; GRAPHENE LAYERS; MICRO RAMAN SPECTROSCOPY; MIS-ORIENTATION; NI SURFACE; OPTIMAL CONDITIONS; POLYCRYSTALLINE; RAPID THERMAL PROCESS; ROTATIONAL DISORDER; SELECTED AREA DIFFRACTION; SURFACE CORRUGATIONS; TRANSMISSION ELECTRON;

GRAPHENE;

EID: 80053246690     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/SSP.178-179.125     Document Type: Conference Paper

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