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Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 7, Issue 3-4, 2010, Pages 1251-1255

Optical, morphological and spectroscopic characterization of graphene on SiO2

(8) Giannazzo, F a Sonde, S a,b Raineri, V a Patane G c Compagnini, G c Aliotta, F d Ponterio, R d Rimini, E a,c

a CNR IMM (Italy)

b SCUOLA SUPERIORE DI CATANIA (Italy)

c UNIVERSITY OF CATANIA (Italy)

d CNR (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION FORCES; AFM; BI-LAYER; CALIBRATION CURVES; FORCE SPECTROSCOPY; GRAPHENE LAYERS; MICRO-RAMAN; NUMBER OF LAYERS; OPTICAL CONTRAST; OXIDE THICKNESS; RELATIVE INTENSITY; SPECTROSCOPIC CHARACTERIZATION; TAPPING MODES; VISIBLE RANGE;

ATOMIC FORCE MICROSCOPY; GRAPHENE; GRAPHITE; MONOLAYERS; OPTICAL MICROSCOPY; SILICON COMPOUNDS;

ATOMIC SPECTROSCOPY;

EID: 77952559077 PISSN: 18626351 EISSN: 16101642 Source Type: Journal
DOI: 10.1002/pssc.200982967 Document Type: Conference Paper

Times cited : (31)

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