Spatially resolved electronic inhomogeneities of graphene due to subsurface charges

Carbon

Volumn 50, Issue 3, 2012, Pages 932-938

  Castellanos Gomez, Andres ^a   Smit, Roel H M ^a,d   Agraït, Nicolás ^a,b,c   Rubio Bollinger, Gabino ^a,b  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^b INSTITUTO NICOLÁS CABRERA   (Spain)

^c INSTITUTO MADRILEÑO DE ESTUDIOS AVANZADOS EN NANOCIENCIA IMDEA NANOCIENCIA   (Spain)

^d LEIDEN UNIVERSITY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGED IMPURITY; CONTACT POTENTIAL DIFFERENCE; ELECTROSTATIC FORCE MICROSCOPES; ELECTROSTATIC FORCE MICROSCOPY; INHOMOGENEITIES; LOCAL TUNNELING BARRIER HEIGHTS; LONG-RANGE ORDERING; NANO-METER SCALE; SPATIALLY RESOLVED; SURFACE DENSITY; TUNNELING CURRENT;

ELECTRIC FORCE MICROSCOPY; ELECTRONIC PROPERTIES; ELECTROSTATIC DEVICES; ELECTROSTATIC FORCE; PROBES; SILICON COMPOUNDS;

GRAPHENE;

EID: 84155164006     PISSN: 00086223     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.carbon.2011.09.055     Document Type: Article

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