Simultaneous current-, force-, and work-function measurement with atomic resolution

Applied Physics Letters

Volumn 86, Issue 15, 2005, Pages 1-3

  Herz, M ^a   Schiller, Ch ^a   Giessibl, F J ^a   Mannhart, J ^a  

^a UNIVERSITY OF AUGSBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CANTILEVER BEAMS; ELECTRIC CHARGE; FERMI LEVEL; FUNCTIONS; OSCILLATIONS; SCANNING TUNNELING MICROSCOPY;

CANTILEVER'S DEFLECTION; METALLIC ELECTRODES; QUANTUM MECHANICAL TUNNELING CURRENT FLOWS; TIP-SAMPLE FORCES;

ELECTRIC CURRENTS;

EID: 20844438166     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1900316     Document Type: Article

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