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Applied Physics Letters

Volumn 96, Issue 21, 2010, Pages

Optical identification of atomically thin dichalcogenide crystals

(3) Castellanos Gomez, A a Agrat, N a,b,c Rubio Bollinger, G a,b

a UNIVERSIDAD AUTÓNOMA DE MADRID (Spain)

b INSTITUTO NICOLÁS CABRERA (Spain)

c INSTITUTO MADRILEÑO DE ESTUDIOS AVANZADOS EN NANOCIENCIA IMDEA NANOCIENCIA (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

FRESNEL; MOLYBDENUM DISULFIDE; NON DESTRUCTIVE; OPTICAL CONTRAST; OPTICAL IDENTIFICATION; SILICON OXIDE LAYERS; SYSTEMATIC STUDY; THIN CRYSTAL; VISIBLE SPECTRA;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; CRYSTALS; ELECTRON ENERGY LEVELS; MOLYBDENUM; MOLYBDENUM OXIDE; MONOLAYERS; NIOBIUM; NIOBIUM OXIDE; OPTICAL MICROSCOPY; REFRACTIVE INDEX; SELENIUM COMPOUNDS; SEMICONDUCTING SILICON COMPOUNDS; SILICON OXIDES;

SILICON WAFERS;

EID: 77956233994 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3442495 Document Type: Article

Times cited : (309)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.