Electrostatic force microscopy using a quartz tuning fork

Applied Physics Letters

Volumn 80, Issue 23, 2002, Pages 4324-4326

  Seo, Yongho ^a   Jhe, Wonho ^a   Hwang, Cheol Seong ^a  

^a Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

DC BIAS; ELECTROSTATIC FORCE MICROSCOPY; FERROELECTRIC DOMAINS; FORCE SENSITIVITY; PIEZOELECTRIC THIN FILMS; Q-FACTORS; QUARTZ TUNING FORK; SPATIAL RESOLUTION; SPRING CONSTANTS; TUNING FORKS;

ELECTRIC FORCE MICROSCOPY; ELECTROSTATIC DEVICES; ELECTROSTATIC FORCE; FERROELECTRIC MATERIALS; FERROELECTRICITY; QUARTZ;

TUNING;

EID: 79956041214     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1485312     Document Type: Article

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