Method to determine the spring constant of atomic force microscope cantilevers

Review of Scientific Instruments

Volumn 75, Issue 2, 2004, Pages 565-567

  Gibson, Christopher T ^a   Johnson, Daniel J ^a   Anderson, Christopher ^a   Abell, Chris ^b   Rayment, Trevor ^b  

^a UNIVERSITY OF NOTTINGHAM   (United Kingdom)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CALIBRATION; ELASTIC MODULI; ELECTRON MICROSCOPES; NATURAL FREQUENCIES; NONDESTRUCTIVE EXAMINATION; OPTICAL MICROSCOPY; REYNOLDS NUMBER; SCANNING ELECTRON MICROSCOPY; SILICON NITRIDE; VISCOSITY;

MOLECULAR FORCE PROBE (MFP); SPRING CONSTANT;

CANTILEVER BEAMS;

EID: 1542638034     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1642750     Document Type: Article

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