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Volumn 47, Issue 43, 2011, Pages 11993-11995
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Piezoresistance behaviors of p-type 6H-SiC nanowires
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Author keywords
[No Author keywords available]
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Indexed keywords
CARBON;
NANOWIRE;
SILICON;
ACCURACY;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
CRYSTAL;
CRYSTALLOGRAPHY;
ELECTRIC RESISTANCE;
MEASUREMENT;
MECHANICAL STRESS;
PIEZOELECTRICITY;
RELIABILITY;
SEMICONDUCTOR;
SENSOR;
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EID: 80054909029
PISSN: 13597345
EISSN: 1364548X
Source Type: Journal
DOI: 10.1039/c1cc14343c Document Type: Article |
Times cited : (56)
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References (34)
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