Structure and electrical properties of Na0.5Bi Na 0.5Bi0.5TiO3 Ferroelectric thick films derived from a polymer modified Sol-Gel method

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Volumn 58, Issue 10, 2011, Pages 2042-2049

  Ji, Hongfen ^a   Ren, Wei ^a   Wang, Lingyan ^a   Shi, Peng ^a   Chen, Xiaofeng ^a   Wu, Xiaoqing ^a   Yao, Xi ^a   Lau, Sien Ting ^b   Zhou, Qifa ^b   Shung, K Kirk ^b  

^a XI'AN JIAOTONG UNIVERSITY   (China)

^b University of Southern California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING TEMPERATURES; DIELECTRIC CONSTANTS; FERROELECTRIC THICK FILMS; LEAD-FREE; MODIFIED SOL-GEL METHOD; PEROVSKITE STRUCTURES; POLYVINYL PYRROLIDONE; REMNANT POLARIZATIONS; THICKNESS DEPENDENCE; TIO;

ANNEALING; DIELECTRIC LOSSES; ELECTRIC PROPERTIES; FERROELECTRICITY; GELS; PEROVSKITE; POLARIZATION; POLYMER FILMS; SODIUM; SOL-GEL PROCESS; SOL-GELS; SOLS; THICK FILMS;

FERROELECTRIC FILMS;

EID: 80054071916     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/TUFFC.2011.2054     Document Type: Article

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