Macroscopic and nanoscale electrical properties of pulsed laser deposited (100) epitaxial lead-free Na0.5Bi0.5TiO3 thin films

Journal of Applied Physics

Volumn 107, Issue 3, 2010, Pages

  Bousquet, M ^a   Duclre J R ^a   Champeaux, C ^a   Boulle, A ^a   Marchet, P ^a   Catherinot, A ^a   Wu, A ^b   Vilarinho, P M ^b   Dputier S ^c   Guilloux Viry, M ^c   Crunteanu, A ^d   Gautier, B ^e   Albertini, D ^e   Bachelet, C ^f  

^a UNIVERSITY OF LIMOGES   (France)

^b UNIVERSITY OF AVEIRO   (Portugal)

^c UNIVERSITÉ DE RENNES 1   (France)

^d UNIVERSITY OF LIMOGES   (France)

^e INSTITUT DES NANOTECHNOLOGIES DE LYON   (France)

^f CENTRE DE CALCUL DE L INSTITUT NATIONAL DE PHYSIQUE NUCLEAIRE ET DE PHYSIQUE DES PARTICULES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BISMUTH COMPOUNDS; CHEMICAL ANALYSIS; CRYSTALLITES; ELECTRIC FIELDS; FERROELECTRICITY; HYSTERESIS; HYSTERESIS LOOPS; LEAKAGE CURRENTS; MAGNESIA; NANOTECHNOLOGY; PLATINUM COMPOUNDS; POLARIZATION; PULSED LASER DEPOSITION; PULSED LASERS; ROOFS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SINGLE CRYSTALS; SODIUM COMPOUNDS; THIN FILMS; TITANIUM COMPOUNDS; X RAY DIFFRACTION;

CHEMICAL COMPOSITIONS; ELECTRIC FIELD CURVES; FERROELECTRIC DOMAINS; FERROELECTRIC PROPERTY; PIEZOFORCE MICROSCOPY; RECIPROCAL LATTICE POINTS; RECIPROCAL SPACE MAPS; X-RAY DIFFRACTION DATA;

EPITAXIAL GROWTH;

EID: 76949104965     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3290956     Document Type: Article

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