Effects of annealing schedule on orientation of Bi3.2Nd0.8Ti3O12 ferroelectric film prepared by chemical solution deposition process

Materials Science and Engineering: B

Volumn 133, Issue 1-3, 2006, Pages 132-135

  He, H Y ^a   Huang, J F ^a   Cao, L Y ^a   Wang, L S ^a  

^a SHAANXI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

Annealing schedule; Bi3.2Nd0.8Ti3O12; Fatigue free; Ferroelectric film; Orientation

Indexed keywords

BISMUTH COMPOUNDS; DEPOSITION; FATIGUE OF MATERIALS; RAPID THERMAL ANNEALING; X RAY DIFFRACTION;

ANNEALING SCHEDULE; BI3.2ND0.8TI3O12; FATIGUE FREE FILMS; THIN FILM ORIENTATION;

FERROELECTRIC THIN FILMS;

EID: 33747848653     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2006.06.022     Document Type: Article

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