Piezoforce microscopy study of lead-free perovskite Na0.5Bi 0.5TiO3 thin films

Applied Physics Letters

Volumn 90, Issue 15, 2007, Pages

  Remondiere F ^a   Wu, A ^b   Vilarinho, P M ^b   Mercurio, J P ^c  

^a JO EF STEFAN INSTITUTE   (Slovenia)

^b UNIVERSITY OF AVEIRO   (Portugal)

^c UNIVERSITY OF LIMOGES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

LEAD; MICROSTRUCTURE; PEROVSKITE; SODIUM COMPOUNDS; SOL-GEL PROCESS; X RAY DIFFRACTION;

ANNEALING PROCESSES; CHEMICAL SOLUTION DEPOSITION; PIEZORESPONSE FORCE MICROSCOPY (PFM);

THIN FILMS;

EID: 34247276132     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2721843     Document Type: Article

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