Characterization of sol-gel Pb(Zr0.53Ti0.47)O3 films in the thickness range 0.25-10 μm

Journal of Materials Research

Volumn 14, Issue 5, 1999, Pages 1852-1859

  Kurchania, Rajnish ^a   Milne, Steven J ^a  

^a UNIVERSITY OF LEEDS   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COATINGS; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; DEPOSITION; FERROELECTRICITY; FIRING (OF MATERIALS); INTERFACES (MATERIALS); LEAD COMPOUNDS; PERMITTIVITY; SOL-GELS;

FILM THICKNESS; LEAD ZIRCONATE TITANATE;

DIELECTRIC FILMS;

EID: 0032674735     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.1999.0249     Document Type: Article

References (28)

1. B. Jaffe, W. R. Cook, and H. Jaffe, Piezoelectric Ceramics (Academic Press, New York, 1971).
2. Landolt-Börnstein New Series: Ferroelectric and Antiferroelectric (Landolt-Börnstein, Berlin, 1975), Vol. 9, p. 119.
3. J. F. Scott and C. A. Paz de Araujo, Science 246, 1400 (1989).
4. H. D. Chen, K. R. Udaykumar, C. J. Gaskey, and L. E. Cross, J. Am. Ceram. Soc. 79, 2189 (1996).
5. K. D. Budd, S. K. Dey, and D. A. Payne, Brit. Ceram. Proc. 36, 107 (1985).
6. S. H. Pyke, Ph.D. Thesis, University of Leeds (1990).
7. G. Yi, Z. Wu, and M. Sayer, J. Appl. Phys. 64, 2717 (1988).
8. G. H. Haertling, Int. Ferroelectrics 3, 207 (1993).
9. G. H. Haertling, Am. Ceram. Soc. Bull. 73 (8), 68 (1994).
10. N. J. Phillips and S. J. Milne, J. Mater. Chem. 1, 893 (1991).
11. N. J. Philips, M. L. Calzada, and S. J. Milne, J. Non-Cryst. Solids 147 & 148, 285 (1990).
12. M. L. Calzada and S. J. Milne, J. Mater. Sci. Lett. 12, 1221 (1993).
13. Y. L. Tu and S. J. Milne, J. Mater. Sci. 30, 2507 (1995).
14. Y. L. Tu, M. L. Calzada, N. J. Philips, and S. J. Milne, J. Am. Ceram. Soc. 79, 441 (1996).
15. Y. L. Tu and S. J. Milne, J. Mater. Res. 11, 2556 (1996).
16. S. Y. Chen and I. W. Chen, J. Am. Ceram. Soc. 77, 2332 (1994).
17. K. G. Brooks, I. M. Reaney, R. Klissurska, Y. Huang, L. Bursill, and N. Setter, J. Mater. Res. 9, 2540 (1994).
18. T. Tani, Z. Xu, and D. A. Payne, in Ferroelectric Thin Films III, edited by E. R. Myers, B. A. Tuttle, S. B. Desu, and P. K. Larsen (Mater. Res. Soc. Symp. Proc. 310, Pittsburgh, PA, 1993), p. 269.
19. C. J. Kim, D. S. Yoon, J. S. Lee, C. J. Choi, and K. No, J. Mater. Res. 12, 1043 (1997).
20. Powder Diffraction File, Card No. 17-64, Joint Committee on Powder Diffraction Standards, Swarthmore, PA (1979).
21. I. M. Reaney, K. Brooks, R. Klissurska, C. Pawlaczyk, and N. Setter, J. Am. Ceram. Soc. 77, 1209 (1994).
22. Y. Sakashita, H. Segawa, K. Tominaga, and M. Okada, J. Appl. Phys. 73, 7857 (1993).
23. J. F. M. Cillessen, M. W. J. Prins, and R. M. Wolf, J. Appl. Phys. 81, 2777 (1997).
24. P. K. Larsen, G. J. M. Dormans, D. J. Taylor, and P. J. van Veldhoven, J. Appl. Phys. 76, 2405 (1994).
25. C. D. E. Lakeman and D. A. Payne, Ferroelectrics 152, 145 (1994).
26. K. Amanuma, T. Mori, T. Hase, T. Sakuma, A. Ocui, and Y. Miyasaka, Jpn. J. Appl. Phys. 32, 4150 (1993).
27. R. E. Newnham, K. R. Udaykumar, and S. Trolier-McKinstry, in Chemical Processing of Advanced Ceramics, edited by L. L. Hench and J. K. Vest (John Wiley, New York, 1992).
28. S. S. Chiang, M. Nishioka, R. M. Fulrath, and J. A. Pask, Ceram. Bull. 60, 484 (1981).