Fabrication and electrical properties of lead zirconate titanate thick films

Journal of the American Ceramic Society

Volumn 79, Issue 8, 1996, Pages 2189-2192

  Chen, H Daniel ^a   Udayakumar, K R ^a,c   Gaskey, Christopher J ^a   Cross, L Eric ^a,c   Bernstein, Jonathan J ^b   Niles, Lance C ^b  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

^b CHARLES STARK DRAPER LABORATORY   (United States)

^c AMERICAN CERAMIC SOCIETY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COATING TECHNIQUES; DIELECTRIC PROPERTIES OF SOLIDS; FERROELECTRICITY; PHASE COMPOSITION; PIEZOELECTRICITY; SEMICONDUCTING LEAD COMPOUNDS; SOL-GELS; THICK FILMS;

CRACK FREE FILMS; LEAD ZIRCONATE TITANATE; MORPHOTROPIC PHASE BOUNDARY COMPOSITION; PIEZOELECTRIC COEFFICIENT; PLATINUM BUFFERED SILICON; SOL GEL SPIN COATING TECHNIQUE;

PIEZOELECTRIC MATERIALS;

EID: 0030214019     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1996.tb08957.x     Document Type: Article

References (8)

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8. K. R. Udayakumar, P. J. Schuele, J. Chen, S. B. Krupanidhi, and L. E. Cross, "Thickness-Dependent Electrical Characteristics of Lead Zirconate Titanate Thin Films," J. Appl. Phys., 77, 3981-86 (1995).