Focussed ion beam-transmission electron microscopy applications in ore mineralogy: Bridging micro- and nanoscale observations

Ore Geology Reviews

Volumn 42, Issue 1, 2011, Pages 6-31

  Ciobanu, C L ^a   Cook, N J ^a,b   Utsunomiya, S ^c   Pring, A ^a,b   Green, L ^a  

^a UNIVERSITY OF ADELAIDE   (Australia)

^b SOUTH AUSTRALIAN MUSEUM   (Australia)

^c KYUSHU UNIVERSITY   (Japan)

Author keywords

(Nano)particles; Cu Fe sulphides; Focussed ion beam; Ore textures; Pb Bi sulphosalts; Pyrite; Sphalerite; Transmission electron microscopy

Indexed keywords

CU-FE-SULPHIDES; FOCUSSED ION BEAM; PB-BI-SULPHOSALTS; SPHALERITE; TRANSMISSION ELECTRON;

BEAM PLASMA INTERACTIONS; BISMUTH; CHEMICAL ANALYSIS; CHEMICAL COMPOUNDS; CRYSTALLOGRAPHY; ELECTRONS; HIGH RESOLUTION ELECTRON MICROSCOPY; ION BEAMS; ION BOMBARDMENT; IONS; LEAD; MINERALOGY; ORES; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; ZINC SULFIDE;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

COPPER; IRON; MINERALOGY; ORE DEPOSIT; ORE MINERAL; PYRITE; SCANNING ELECTRON MICROSCOPY; SPHALERITE; SULFIDE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 80053602437     PISSN: 01691368     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.oregeorev.2011.06.012     Document Type: Article

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